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Software for Jazz® and M90™/M91™ - All-in-One OLC and HMI Applications in One Environment
U90 Ladder
All-in-One software enables you to:- Develop your PLC and HMI applications in one environment- Configure Hardware & Communications- Establish modem and data communications- Test and debug your programs
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ICT with LED Testing
TR5001 SII Series
• Multi-Core Parallel Tester• Serial Test Controller with up to 8 ports on any pin• PXI Ready• Self Diagnostics• Auto-Calibration function• High-Accuracy Measurement• SMEMA compatible• Easy Program Development - Flow Based
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Universal Tester Software Platform
APG (Automatic Program Generator) is a user-friendly 32-bit programming system aimed at providing fast and easy test program creation. It is a powerful Windows Application with all of the features of the Windows® environment enhanced by Autotest’s own Multi-Tasking Windows control.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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High Parallel Test Of Inertial Sensors Up To 9DOF
InGyro Test Module
The InGyro sensor test module and functional test program for physical stimulation of inertial sensors under temperature conditions supports multiple target applications: accelerometers, gyroscopes, as well as multi-axis IMU’s (inertial measurement units) up to 9DOF (Degrees of Freedom). To meet the requirements of automotive and other demanding applications the temperature range the InGyro module supports testing at temperatures from -40°C to +125°C.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Extensometers
Extension measurement is one of the areas that complements our range of UTM program. The result is a comprehensive range of high class variations. The product selection is arranged as follows:*Non-contact extensometers with and without measurement marks.*Contact extensometers: Sensor arm extensometers, incremental and analogue clip-on extensometers as well as extensometers for compression and flexure tests.
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GPIB to LAN Printer Interface
Model 4872
* Adds a GPIB Interface to Ethernet Printers. * Replaces obsolete printers and plotters with a current HPGL/PCL5 printer.* Secondary output copies instrument print file to a PC for later printing with our Data Logger program.* Automatically finds and links to most printers.* Built-in test page confirms 4872 to printer operation.* No program changes required.* Rack mountable in 1 U high rack mount kit.* Includes universal VAC Power Adapter and LAN crossover cable.
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Compact EMC Test System
Multi-CE5
The Multi-CE5 includes an Electrical Fast Transient Generator (EFTG), a Combination Wave Generator (CWG) and a Coupling-/Decoupling Network (CDN) for single-phase power supply lines. The software program CE-REMOTE allows full remote control of the test generator via Ethernet light guide as well as recording, evaluation and documentation of test results, according to IEC 17025. To record the wave shape of impulses, it is equipped with an Impulse Recording Function (IRF).
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Civil Communications Test
Astronics communications test sets for civil tactical radios, transportation communications, and other civil systems keep your critical communications running at peak performance. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.Deployed globally for nearly 20 years, Astronics communications test solutions deliver the dependability you require to ensure critical communications safety and security.
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Drug Stability Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
If you want find complete details about Integrated drug stability test chamber, Drug stability test chamber, Chemical drug stability test chamber, New designed integrated drug chamber, Good quality integrated drug test chamber - China Sanwood Environmental Chambers Co., Ltd. The scientific method to create a drug for a long time to failure evaluation of stable temperature, humidity and light environment for pharmaceutical enterprises to accelerate drug test, long-term test, high humidity and strong light test, is the best choice for pharmaceutical companies and drug stability test program.
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Fatigue Testing And Certification
Fatigue engineering is subject to uncertainty, and data from well executed tests are used to validate conclusions made by analysis and to provide a basis for structural certification. Our staff have extensive experience in testing materials and components under slowly varying, static loads, and under rapidly varying cyclic loads. Tests under static loads are used to assess material properties or to assess the load-deformation behavior of structural components. Tests under cyclic loads provide ti...show more -
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PXIe-7820, Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module
783484-01
Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers s...show more -
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Test Adapter
FECVF1600
Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
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Prodution Testers
Effitest E50
Effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
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Content based revision compare of Test Programs
Test program Comparator
TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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ICT - Flexible Multi-Core Parallel/Merged-Core Tester
TR5001 SII QDI SERIES
• Flexible Multi-Core Parallel / Merged-Core Tester• Serial Test Controller with up to 8 ports on any pin• Light - Curtain Protected Press - Down Platform• PXI Ready• Built-in Self Diagnostics and Auto-Calibration function• High-Accuracy Measurement• Flow - based Easy Program Development
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Test Solutions For OEMs
A partnership with Testek Solutions fits into your business because we do business like youdo business. Our partnerships are built on open communication, process transparency, and trust – trust that is built on our proven engineering design process. We assign a dedicated team consisting of a program manager who will be your single-point-of-contact, an experienced project engineer to design and oversee all engineering on the project, and any supporting engineers and manufacturing team members nec...show more -
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Quick Access Recorders
QAR
Two QAR styles are available depending on the features needed, both include our specialized Silo™ Quick Access Recorder Software. Silo QAR with webFB hardware is the ideal certified solution for programs on Boeing 737 aircraft. It quickly attaches to the Flight Data Recorder (FDR) test receptacle and gathers data using the ARINC 717 protocol. For applications on other aircraft or using other protocols, Silo QAR with webCS hardware includes ARINC 429 and Discrete interfaces in addition to ARINC 717.
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Humidity Chambers
Shanghai Morningtest Environmental Chambers Co.,Ltd.
Humidity chambers offer a wide range of standard solutions for your testing program. Environmental testing with a humidity chamber helps improve product reliability and durability. Humidity chambers are available in a variety of styles, sizes, and performance configurations. All humidity chambers come with a standard temperature range for combined temperature and humidity testing.Humidity may affect the life expectancy of a component by creating stresses on the part materials and altering its el...show more -
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CB Scheme
The CB scheme is an international program promoting global harmonisation and the reduction of trade barriers. Originally implemented to coordinate the acceptance of product safety test results among laboratories and certification organisations worldwide, the CB scheme provides manufacturers multiple national safety certifications for their products with a single CB certificate.The CB scheme actually consists of one single audit and certification procedure to demonstrate the safety of your electr...show more -
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Single Space Electro-hydraulic Servo Universal Testing Machine
WAW-F Series
Jinan Testing Equipment IE Corporation
WAW-F series single space Servo-Hydraulic Testing System Computerized is suitable for testing tension, compression and other strengths of various metallic or nonmetallic materials with high strength. The ultra-large testing space & dual-action actuator with longer stroke enable it to test not only standard specimen, but also longer ones with long elongation every so often. Equipped with the electronics, computer &software packages, it is capable of controlling the test procedures by the ...show more -
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FD-11614, 16-Channel Temperature Input Device for FieldDAQ
785854-01
The FD-11614 measures up to 16 thermocouple channels. It features cold-junction compensation and open thermocouple detection with an LED indicator per channel to identify disconnected thermocouples. The FD-11614 has an ingress … protection rating up to IP67 (dust- and water-resistant), can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11614 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11614 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. This device is ideal for test cell and outdoor environments.
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FaultFinder VIP
The compact and portable Faultfinder VIP system, combined with a Laptop running TestVue software, provides a way to rapidly identify failures by troubleshooting a PCB or CCA. It uses impedance signatures (also known as VI testing) measured from a known working circuit and stores them as a test program. These stored signatures are then compared to the ones being measured on the suspect circuit to automatically determine if there is a fault.
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Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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Test & Measurement Services
We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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Test Development
Best Electronics and Components Co., Inc.
USEA is involved at all levels of test development, including the necessary test board design and layout, software development, socket design and build, etc. We work on programs at all stages of the product development timeline and through to manufacturing.
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High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Eac...show more
