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High Strength Electro-hydraulic Servo Universal Testing Machine
WAW-H Series
Jinan Testing Equipment IE Corporation
WAW-H series Servo-Hydraulic Testing Machine Computerized is suitable for testing tension, compression, bending and shearing strength of various metallic & non-metallic materials. Equipped with the electronics, computer &software packages, it is capable of controlling the test procedures by the predetermined programs. The Servo-Hydraulic Testing Machine Computerized can also display, record, process and print the test results. The test curves can be drawn automatically in real time. The ...show more -
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FPGA Testing
Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Certified By SANBlaze
With the Certified by SANBlaze program NVMe SSD Manufacturers can run a series of automated tests to determine if their drives are running correctly and that they are complaint with the latest specs. Alerts of Failures or Warnings are shown if one or more drives is not behaving the way that it should, allowing for the quick diagnosing of any problems before the drives go out into the field. The Certified by SANBlaze tests are bundled with the software when customers purchase a Gen 4 SANBlaze SBE...show more -
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Civil Communications Test
Astronics communications test sets for civil tactical radios, transportation communications, and other civil systems keep your critical communications running at peak performance. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.Deployed globally for nearly 20 years, Astronics communications test solutions deliver the dependability you require to ensure critical communications safety and security.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltag...show more -
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Video QoS Monitoring Web Management Software
TSM Web
The TSM Web is a web service program for managing Mividi Video Monitoring Systems or Multiviewer Systems. It provides an Internet gateway to Mividi Video Monitoring servers in order to remotely access test results and configure the test servers using the Internet.
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PCI Express Host Interface SSD/Drive Decode Support
Teledyne LeCroy provides NVM Express, SATA Express and SCSI Express protocol decoding, analysis and test equipment to SSD storage companies worldwide. It works closely with the following organizations providing equipment to its members and conformance programs.
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Combo Tester
750
The ACL 750 Combo-Tester measures electrical resistance of wrist straps and heel grounders simultaneously and individually. The ACL 750 can do what Pass/Fail testers cannot: Give actual resistance readings and store data. When the software is used, test results are stored on a computer which allows you to monitor and analyze test information and help manage your company?s static control program. Results can be stored from each test for up to one year in your computer.
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JETCAL® Engine Analyze
BH112JD-80
An operator can program the Data Acquisition Unit (DAU) withthe appropriate frequency and pressure calibrations required totest 10 selectable engine types. Test results may then be printedimmediately using the printer installed in the unit.
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Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Solar Spectrum Test Chamber / Solar Radiation Test Chamber
WEIBER Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instrum...show more -
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Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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C Series Functional Safety Module
The C Series Functional Safety Module offers SIL 3 certification, according to IEC 61508. The safety logic solver resides inside the module, and you can program it with the included Functional Safety Editor software. The module contains built-in diagnostics that can monitor the status of the hardware and the integrity of the connections. You can use these modules to control critical safety functions in manufacturing assembly and test cells, large physical tests, condition monitoring applications, and process monitoring and control.
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Aging and Life Test Rack
SY2036
SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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Battery Test Software
Landt Battery Test Systems use different programs for data acquiring and data process. The acquiring software comes with a very user-friendly interface, which allows new users to operate with minimal training. Data process software shows different kinds of plots (Voltage vs. Capacity, Capacity vs. Cycle Number, Efficiency, etc.), which can be easily exported.
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a compl...show more -
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Furniture Testing
We can test to ANSI/BIFMA or any government, military or industrial test standard. American Testing Laboratory can design a specific furniture testing program tailored to meet your particular needs.
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Walk-In Solar Spectrum Test Chamber
WEIBER walk in Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring...show more -
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Automated Test Environment
AS5657-ATE
The AS5657 Automated Test Environment (AS5657-ATE) is designed to automate device compliance testing according to the SAE-AS5657 “Test Plan/Procedure for AS5643 IEEE-1394b Interface Requirements for Military and Aerospace Vehicle Applications”. The purpose of this tool is to automate and simplify the task of AS5643 compliance verification and testing, which of course is essential for device compatibility within avionics and aerospace programs.
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Auto Loading Durometer
P2 Auto Durometers maximize the repeatability of hardness tests. The P2 features digital speed control to ensure constant speed during hardness tests. The proprietary flexible coupling ensures perfect contact with test samples. All operation and program functions are controlled using the touch screen LCD panel or remotely using an Ethernet connection. Both automated or manual tests can be performed. Dual timers enable recording of the “creep phenomenon” or tendency of the reading to move back as time elapses from the moment the sensor makes full contact with the sample.
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Vector Network Analyzer (VNA) Simulator – Advanced
S94051B
S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.
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GPIB Instrument Scripting and Configuration Software
RemoteControl
RemoteControl V3.0 allows you to easily program RF test equipment using GPIB instructions, without the usual overhead of having to write a suitable computer program first.
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Pattern Conversion
Wave Wizard
Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Content based revision compare of Test Programs
Test program Comparator
TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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Electrical Fast Transient Pulse Group Generator
SKS-0404IB
Shanghai Sanki Electronic Industries Co., Ltd.
Electrical fast transient pulse group generator SKS-0404IB fully complies with the new standards of IEC61000-4-4, EN61000-4-4 and GB/T17626.4; provides pulse test voltage up to 4500V, which can meet various product standards Severity level ; pulse frequency up to 1MHz, and continuously adjustable; imported discharge switch, high precision, long life, good reproducibility; using 7-inch true color touch screen control, convenient for users to directly program and control.
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Climatic Chamber
Wewon Environmental Chambers Co, Ltd.
Climatic chamber is designed to do high temperature & high humidity, high and low temperature, or temperature cycling test, Climatic chamber mainly used for quality checking and assessing their quality reliability and life test. ● The climatic chamber simulate a full range of temperature testing and humidity testing conditions.These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the ...show more -
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100 High Speed Programmer
Commander Accelerator
The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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Program Development for Multisite Test
IG-XL
Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Load Cell Simulator
LCS-3
Load cell simulator particularly useful in a test environment for example to check a program sequence of a controller. The LCS-3 is a simulator used as a substitute for strain gage transducers to generate the precise mV/V signals required in the development , checkout and pre-calibration of signal conditioners, digital and analog readouts and data loggers.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
